The width height diameter measurement systems μMETER-X of ELOVIS are used for non-contact cross-section measurement of profiles, strip goods and discrete parts in the production process, during conveying movement in the longitudinal direction. The highly accurate measurement in the light scanner generally serves production monitoring, process optimization and documentation of the delivery status of all manufactured goods. μMETER-X systems use light reflection or transmitted light. μMETER-X systems are maintenance-free, permanently calibrated and measure largely independent of the material. As a kind of “optical caliper”, μMETER-X systems are used for cross-section measurement, profile measurement as well as measurement of width, height, diameter … of web, tape, profiles, tube, plate, board, beam, bolt and roller made out of different materials.